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Peretti, Vanni (2008) Development of reliable RF-MEMS switches for antennas and space applications. [Tesi di dottorato]

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Abstract (inglese)

Radio Frequency Micro Electro Mechanical (RF-MEMS) components are a contender for future
low-power high-frequency wired reconfigurable networks and wireless communication
systems. In many RF applications, a single MEM component can replace and outperform an
entire solid-state circuit; in other applications, a judicious association of MEMS with active
devices will result in smart communicating circuits and systems. These MEMdevices have the
potential to surpass the limits of today’s equivalent implementations that use only traditional
solid-state technology. However, the scarce maturity of this technology makes these devices
suffering of severe reliability issues. The purpose of this thesis is to investigate the reliability
of RF-MEMS switches, starting from common measurements tests, like cycling and DC characterization,
to more particular stresses, like Electro Static Discharge (ESD) or Radiations for
space applications qualification.

Abstract (italiano)

Gli switchMicro-Elettro Meccanici per Radio Frequenza (RF-MEMS) sono tra i dispositivi più
promettenti per le future generazioni di network riconfigurabili ad alta frequenza e basso consumo
di potenza. Vi sono applicazioni RF in cui un singolo dispositivo MEMS può sostituire
e migliorare in termini di prestazioni un intero circuito a stato solido; in altri campi invece,
un opportuno connubio fra tecnologia MEMS e dispositivi attivi può portare alla nascita di
sistemi di comunicazioni estremamente brillanti e performanti. Infatti, i dispositivi MEMS
hanno in loro le potenzialità per sorpassare i limiti delle attuali tecnologie impiegate basate
su circuiti integrati. Tuttavia, la mancanza di maturità di una tecnologia così innovativa porta
con sé inevitabili problemi affidabilistici. L’obbiettivo di questa tesi è di analizzare l’aspetto
affidabilistico degli switch RF MEMS, cominciando da metodi comuni di caratterizzazione e
stress, come la caratterizzazione DC e il Cycling stress, fino a test più specifici, come la robustezza
a scariche elettrostatiche (ESD) o il monitoraggio di danni indotti da radiazione per la
qualificazione dei dispositivi per missioni spaziali.

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Tipo di EPrint:Tesi di dottorato
Relatore:Meneghesso, Gaudenzio
Dottorato (corsi e scuole):Ciclo 21 > Scuole per il 21simo ciclo > INGEGNERIA DELL'INFORMAZIONE > INGEGNERIA ELETTRONICA E DELLE TELECOMUNICAZIONI
Data di deposito della tesi:24 Gennaio 2009
Anno di Pubblicazione:15 Ottobre 2008
Parole chiave (italiano / inglese):RF-MEMS, switches, ESD, cycling stress, Radiation
Settori scientifico-disciplinari MIUR:Area 09 - Ingegneria industriale e dell'informazione > ING-INF/01 Elettronica
Struttura di riferimento:Dipartimenti > Dipartimento di Ingegneria dell'Informazione
Codice ID:1397
Depositato il:24 Gen 2009
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Bibliografia

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