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Bordignon, Silvano and Scagliarini, Michele (2001) Statistical analysis of process capability indices with measurement errors. [Working Paper] WORKING PAPER SERIES, 10/2001 . , PADOVA (Inedito)

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Abstract (english)

Process capability indices (PCIs) have been widely used in manufacturing industries to provide a quantitative measure of process potential and performance. While some efforts have been dedicated in the literature to the statistical properties od PCIs estimators, scarce attention has been given to the evaluation of these properties when sample data are affected by measurement errors. In this work we deal with the problem of measurement errors effects on the performance of PCIs. The analysis is illustrated with reference to Cp and Cpk, i.e. the two most common measures suggested to evaluate process capability.

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EPrint type:Working Paper
Anno di Pubblicazione:18 May 2001
Key Words:Process capability indices, measurement errors, Cp, Cpk, statistical properties of PCIs estimators.
Settori scientifico-disciplinari MIUR:Area 13 - Scienze economiche e statistiche > SECS-S/01 Statistica
Struttura di riferimento:Dipartimenti > Dipartimento di Scienze Statistiche
Codice ID:7359
Depositato il:12 Dec 2014 10:16
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